2cs6134 2010-03-07 1 toshiba transistor silicon npn epitaxial type 2SC6134 high-speed switching applications dc-dc converter applications strobe applications ? high dc current gain: h fe = 250 to 400 (i c = 0.3a) ? low collector-emitter saturation voltage: v ce (sat) = 0.14 v (max) ? high-speed switching: t f = 25 ns (typ.) absolute maximum ratings (ta = 25c) characteristics symbol rating unit collector-base voltage v cbo 50 v collector-emitter voltage v cex 50 v collector-emitter voltage v ceo 30 v emitter-base voltage v ebo 6 v dc i c 3.0 collector current pulse i cp 5.0 a base current i b 0.3 a p c (note1) 800 collector power dissipation p c (note2) 500 mw junction temperature t j 150 c storage temperature range t stg ? 55 to 150 c note1: mounted on ceramic board. (25.4 mm 25.4 mm 0.8 mm, cu pad: 645 mm 2 ) note2: mounted on fr4 board. (25.4 mm 25.4 mm 1.6 mm, cu pad: 645 mm 2 ) note3: using continuously under heav y loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the re liability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc. ) are within the absolute maximum ratings. please design the appropriate reliability upon reviewing the toshiba semiconductor reliability handbook (?handling precautions?/?derating concept and methods?) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). unit: mm jedec D jeita D toshiba 2-2u1a weight: 6.6 mg (typ.) -0.05 1.70.1 2.10.1 0.650.05 1 2 2.00.1 3 0.70.05 +0.1 0.3 0.1660.05 1 :gate 2 :source 3 :drain ufm
2cs6134 2010-03-07 2 electrical characteristics (ta = 25c) characteristics symbol test condition min typ. max unit collector cut-off current i cbo v cb = 50 v, i e = 0 ? ? 100 na emitter cut-off current i ebo v eb = 6 v, i c = 0 ? ? 100 na collector-emitter breakdown voltage v (br) ceo i c = 10 ma, i b = 0 30 ? ? v h fe (1) v ce = 2 v, i c = 0.3 a 250 ? 400 dc current gain h fe (2) v ce = 2 v, i c = 1.0 a 120 ? ? collector-emitter saturation voltage v ce (sat) i c = 1.0 a, i b = 33 ma ? ? 0.14 v base-emitter saturation voltage v be (sat) i c = 1.0 a, i b = 33 ma ? ? 1.10 v collector output capacitance c ob v cb = 10 v, i e = 0, f = 1 mhz ? 18 ? pf rise time t r ? 40 ? storage time t stg ? 320 ? switching time fall time t f see figure 1. v cc 12 v, r l = 12 i b1 = ?i b2 = 33 ma ? 25 ? ns w part no. (or abbreviation code) figure 1 switching time test circuit & timing chart i b2 i b1 20 s output input i b2 i b1 r l v cc duty cycle < 1% marking
2cs6134 2010-03-07 3 base-emitter voltage v be (v) collector current i c (a) base-emitter saturation voltage v be (sat) (v) collector-emitter voltage v ce (v) i c ? v ce collector current i c (a) collector current i c (a) h fe ? i c dc current gain h fe collector current i c (a) v ce (sat) ? i c collector-emitter saturation voltage v ce (sat) (v) collector current i c (a) v be (sat) ? i c i c ? v be i c ? v ce 0 0 0.8 2.0 2.4 1.0 2.5 3.0 4 i b = 2 ma 20 10 6 2.0 1.6 0.4 15 8 1.5 0.5 1.2 common emitter ta = 25c single nonrepetitive pulse 0.001 10 10 100 1000 0.01 0.1 ta = 100c ? 55c 25c 1 common emitter v ce = 2 v single nonrepetitive pulse 0.001 0.01 10 1 0.1 0.01 0.1 ta = 100c ? 55c 25c 1 common emitter i c /i b = 30 single nonrepetitive pulse 0.1 10 1 0.001 10 0.01 0.1 ta = ? 55c 100c 25c 1 common emitter i c /i b = 30 single nonrepetitive pulse 0 0 1.2 3.0 ? 55c ta = 100c 25c 2.5 1.5 0.8 0.2 0.4 2.0 0.5 1.0 0.6 1.0 common emitter v ce = 2 v single nonrepetitive pulse
2cs6134 2010-03-07 4 restrictions on product use ? toshiba corporation, and its subsidiaries and affiliates (collect ively ?toshiba?), reserve the right to make changes to the in formation in this document, and related hardware, software a nd systems (collectively ?product?) without notice. ? this document and any information herein may not be reproduc ed without prior written permission from toshiba. even with toshiba?s written permission, reproduction is permissible only if reproduction is without alteration/omission. ? though toshiba works continually to improve product?s quality a nd reliability, product can malfunction or fail. customers are responsible for complying with safety standards and for prov iding adequate designs and safeguards for their hardware, software and systems which minimize risk and avoid sit uations in which a malfunction or failure of product could cause loss of human life, b odily injury or damage to property, including data loss or corruption. before customers use the product, create designs including the product, or incorporate the product into their own applications, customers mu st also refer to and comply with (a) the latest versions of all relevant toshiba information, including without limitation, this document, the specificati ons, the data sheets and application notes for product and the precautions and conditions set forth in the ?toshiba semiconduc tor reliability handbook? and (b) the instructio ns for the application with which the product will be used with or for. customers are solely responsible for all aspects of their own product design or applications, including but not lim ited to (a) determining the appropriateness of the use of this product in such des ign or applications; (b) evaluating and dete rmining the applicability of any information contained in this document, or in charts, dia grams, programs, algorithms, sample application circuits, or any other referenced document s; and (c) validating all operating paramete rs for such designs and applications. toshiba assumes no liability for customers? product design or applications. ? product is intended for use in general el ectronics applications (e.g., computers, personal equipment, office equipment, measur ing equipment, industrial robots and home electroni cs appliances) or for specif ic applications as expre ssly stated in this document . product is neither intended nor warranted for use in equipment or systems that require extraordinarily high levels of quality a nd/or reliability and/or a malfunction or failure of which may cause loss of human life, bodily injury, serious property damage or se rious public impact (?unintended use?). unintended use includes, without limit ation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equi pment used for automobiles, trains, ships and other transportation, traffic signalin g equipment, equipment used to control combustions or explosions, safety dev ices, elevators and escalato rs, devices related to el ectric power, and equipment used in finance-related fi elds. do not use product for unintended us e unless specifically permitted in thi s document. ? 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